Ron Paulsen

A Comparison of Wearable Tonometry, Photoplethysmography, and Electrocardiography for Cuffless Measurement of Blood Pressure in an Ambulatory Setting

Becky Mieloszyk, Hope Twede, Jonathan Lester, Jeremiah (Miah) Wander, Sumit Basu, Gabe Cohn, Greg Smith, Sidhant Gupta, Desney Tan, Nicolas Villar, Moni Wolf, Sailaja Malladi, Ron Paulsen, Scott Saponas

IEEE Journal of Biomedical and Health Informatics | July 2022, Vol 26(7): pp. 2864-2875

Publication

Floating-Gate Nonvolatile Memory With Ultrathin 5-nm Tunnel Oxide

Ron Paulsen

IEEE Transactions on Electron Devices | November 2008, Vol 55(12): pp. 3476-3481

DOI Publication Publication

Scaling tunneling oxide to 50Å in floating-gate logic NVM at 65nm and beyond

Ron Paulsen

2007 International Integrated Reliability Workshop | September 2007

DOI Publication Publication

Highly Reliable 90-nm Logic Multitime Programmable NVM Cells Using Novel Work-Function-Engineered Tunneling Devices

Ron Paulsen

IEEE Transactions on Electron Devices | August 2007, Vol 54(9): pp. 2526-2530

DOI Publication Publication Publication Publication

Reliability of a 90nm Embedded Multi-time Programmable Logic NVM Cells Using Work-function Engineered Tunneling Device

Ron Paulsen

2007 International Reliability Physics Symposium | March 2007

DOI Publication Publication

A Sensitive Technique to Enable Technology Transfer and Fab Matching in Deep Sub-Micron Technologies ISSM Paper: PC-O-193

Ron Paulsen

December 2006

PDF

Reliability and Qualification of a Floating Gate Memory Manufactured in a Generic Logic Process for RFID Applications

Ron Paulsen

May 2006

DOI Publication

Charge retention of silicided and unsilicided floating gates in embedded logic nonvolatile memory

Ron Paulsen

2005 International Integrated Reliability Workshop | October 2005

DOI Publication

Measurement of ultralow gate tunneling currents using floating-gate integrator technique

Ron Paulsen

IEEE Electron Device Letters | May 2005, Vol 26(5): pp. 329-331

DOI Publication Publication

Effect of layout orientation on the performance and reliability of high voltage N-LDMOS in standard submicron logic STI CMOS process

Ron Paulsen

2005 International Reliability Physics Symposium | April 2005

DOI Publication

Reliability of pFET EEPROM with 70-/spl Aring/ tunnel oxide manufactured in generic logic CMOS Processes

Ron Paulsen

IEEE Transactions on Device and Materials Reliability | December 2004, Vol 4(3): pp. 353-358

DOI Publication

A reliability methodology for low temperature data retention in floating gate non-volatile memories

Ron Paulsen

2001 International Reliability Physics Symposium | April 2001

DOI Publication

Post poly-Si gate rapid thermal nitridation for boron penetration reduction and oxide reliability improvement

Ron Paulsen

IEEE Electron Device Letters | June 1998, Vol 19(7): pp. 237-240

DOI Publication

Process integration of an interlevel dielectric (ILDO) module using a building-in reliability approach

Ron Paulsen

IEEE Transactions on Electron Devices | February 1998, Vol 45(3): pp. 655-664

DOI Publication Publication

Observation and characterization of near-interface oxide traps with C-V techniques

Ron Paulsen

IEEE Transactions on Electron Devices | October 1995, Vol 42(11): pp. 2004-2009

DOI Publication Publication Publication

MOS device reliability studies under LabVIEW environment

Ron Paulsen

1994 International Electron Devices Meeting | December 1994

DOI Publication

Theory and application of charge pumping for the characterization of Si-SiO/sub 2/ interface and near-interface oxide traps

Ron Paulsen

IEEE Transactions on Electron Devices | June 1994, Vol 41(7): pp. 1213-1216

DOI Publication Publication

Observation of near-interface oxide traps with the charge-pumping technique

Ron Paulsen

IEEE Electron Device Letters | November 1992, Vol 13(12): pp. 627-629

DOI Publication Publication

A reliability methodology for low temperature data retention in floating gate non-volatile memories

Ron Paulsen

2001 International Reliability Physics Symposium | April 2001

DOI Publication

Post poly-Si gate rapid thermal nitridation for boron penetration reduction and oxide reliability improvement

Ron Paulsen

IEEE Electron Device Letters | June 1998, Vol 19(7): pp. 237-240

DOI Publication

Process integration of an interlevel dielectric (ILDO) module using a building-in reliability approach

Ron Paulsen

IEEE Transactions on Electron Devices | February 1998, Vol 45(3): pp. 655-664

DOI Publication Publication

Observation and characterization of near-interface oxide traps with C-V techniques

Ron Paulsen

IEEE Transactions on Electron Devices | October 1995, Vol 42(11): pp. 2004-2009

DOI Publication Publication Publication

MOS device reliability studies under LabVIEW environment

Ron Paulsen

1994 International Electron Devices Meeting | December 1994

DOI Publication

Theory and application of charge pumping for the characterization of Si-SiO/sub 2/ interface and near-interface oxide traps

Ron Paulsen

IEEE Transactions on Electron Devices | June 1994, Vol 41(7): pp. 1213-1216

DOI Publication Publication

Observation of near-interface oxide traps with the charge-pumping technique

Ron Paulsen

IEEE Electron Device Letters | November 1992, Vol 13(12): pp. 627-629

DOI Publication Publication

A Comparison of Wearable Tonometry, Photoplethysmography, and Electrocardiography for Cuffless Measurement of Blood Pressure in an Ambulatory Setting

Becky Mieloszyk, Hope Twede, Jonathan Lester, Jeremiah (Miah) Wander, Sumit Basu, Gabe Cohn, Greg Smith, Sidhant Gupta, Desney Tan, Nicolas Villar, Moni Wolf, Sailaja Malladi, Ron Paulsen, Scott Saponas

IEEE Journal of Biomedical and Health Informatics | July 2022, Vol 26(7): pp. 2864-2875

Publication

Floating-Gate Nonvolatile Memory With Ultrathin 5-nm Tunnel Oxide

Ron Paulsen

IEEE Transactions on Electron Devices | November 2008, Vol 55(12): pp. 3476-3481

DOI Publication Publication

Scaling tunneling oxide to 50Å in floating-gate logic NVM at 65nm and beyond

Ron Paulsen

2007 International Integrated Reliability Workshop | September 2007

DOI Publication Publication

Highly Reliable 90-nm Logic Multitime Programmable NVM Cells Using Novel Work-Function-Engineered Tunneling Devices

Ron Paulsen

IEEE Transactions on Electron Devices | August 2007, Vol 54(9): pp. 2526-2530

DOI Publication Publication Publication Publication

Reliability of a 90nm Embedded Multi-time Programmable Logic NVM Cells Using Work-function Engineered Tunneling Device

Ron Paulsen

2007 International Reliability Physics Symposium | March 2007

DOI Publication Publication

A Sensitive Technique to Enable Technology Transfer and Fab Matching in Deep Sub-Micron Technologies ISSM Paper: PC-O-193

Ron Paulsen

December 2006

PDF

Reliability and Qualification of a Floating Gate Memory Manufactured in a Generic Logic Process for RFID Applications

Ron Paulsen

May 2006

DOI Publication

Charge retention of silicided and unsilicided floating gates in embedded logic nonvolatile memory

Ron Paulsen

2005 International Integrated Reliability Workshop | October 2005

DOI Publication

Measurement of ultralow gate tunneling currents using floating-gate integrator technique

Ron Paulsen

IEEE Electron Device Letters | May 2005, Vol 26(5): pp. 329-331

DOI Publication Publication

Effect of layout orientation on the performance and reliability of high voltage N-LDMOS in standard submicron logic STI CMOS process

Ron Paulsen

2005 International Reliability Physics Symposium | April 2005

DOI Publication

Reliability of pFET EEPROM with 70-/spl Aring/ tunnel oxide manufactured in generic logic CMOS Processes

Ron Paulsen

IEEE Transactions on Device and Materials Reliability | December 2004, Vol 4(3): pp. 353-358

DOI Publication

A Comparison of Wearable Tonometry, Photoplethysmography, and Electrocardiography for Cuffless Measurement of Blood Pressure in an Ambulatory Setting

Becky Mieloszyk, Hope Twede, Jonathan Lester, Jeremiah (Miah) Wander, Sumit Basu, Gabe Cohn, Greg Smith, Sidhant Gupta, Desney Tan, Nicolas Villar, Moni Wolf, Sailaja Malladi, Ron Paulsen, Scott Saponas

IEEE Journal of Biomedical and Health Informatics | July 2022, Vol 26(7): pp. 2864-2875

Publication

A reliability methodology for low temperature data retention in floating gate non-volatile memories

Ron Paulsen

2001 International Reliability Physics Symposium | April 2001

DOI Publication

MOS device reliability studies under LabVIEW environment

Ron Paulsen

1994 International Electron Devices Meeting | December 1994

DOI Publication

Scaling tunneling oxide to 50Å in floating-gate logic NVM at 65nm and beyond

Ron Paulsen

2007 International Integrated Reliability Workshop | September 2007

DOI Publication Publication

Reliability of a 90nm Embedded Multi-time Programmable Logic NVM Cells Using Work-function Engineered Tunneling Device

Ron Paulsen

2007 International Reliability Physics Symposium | March 2007

DOI Publication Publication

Reliability and Qualification of a Floating Gate Memory Manufactured in a Generic Logic Process for RFID Applications

Ron Paulsen

May 2006

DOI Publication

Charge retention of silicided and unsilicided floating gates in embedded logic nonvolatile memory

Ron Paulsen

2005 International Integrated Reliability Workshop | October 2005

DOI Publication

Effect of layout orientation on the performance and reliability of high voltage N-LDMOS in standard submicron logic STI CMOS process

Ron Paulsen

2005 International Reliability Physics Symposium | April 2005

DOI Publication

Post poly-Si gate rapid thermal nitridation for boron penetration reduction and oxide reliability improvement

Ron Paulsen

IEEE Electron Device Letters | June 1998, Vol 19(7): pp. 237-240

DOI Publication

Process integration of an interlevel dielectric (ILDO) module using a building-in reliability approach

Ron Paulsen

IEEE Transactions on Electron Devices | February 1998, Vol 45(3): pp. 655-664

DOI Publication Publication

Observation and characterization of near-interface oxide traps with C-V techniques

Ron Paulsen

IEEE Transactions on Electron Devices | October 1995, Vol 42(11): pp. 2004-2009

DOI Publication Publication Publication

Theory and application of charge pumping for the characterization of Si-SiO/sub 2/ interface and near-interface oxide traps

Ron Paulsen

IEEE Transactions on Electron Devices | June 1994, Vol 41(7): pp. 1213-1216

DOI Publication Publication

Observation of near-interface oxide traps with the charge-pumping technique

Ron Paulsen

IEEE Electron Device Letters | November 1992, Vol 13(12): pp. 627-629

DOI Publication Publication

A Comparison of Wearable Tonometry, Photoplethysmography, and Electrocardiography for Cuffless Measurement of Blood Pressure in an Ambulatory Setting

Becky Mieloszyk, Hope Twede, Jonathan Lester, Jeremiah (Miah) Wander, Sumit Basu, Gabe Cohn, Greg Smith, Sidhant Gupta, Desney Tan, Nicolas Villar, Moni Wolf, Sailaja Malladi, Ron Paulsen, Scott Saponas

IEEE Journal of Biomedical and Health Informatics | July 2022, Vol 26(7): pp. 2864-2875

Publication

Floating-Gate Nonvolatile Memory With Ultrathin 5-nm Tunnel Oxide

Ron Paulsen

IEEE Transactions on Electron Devices | November 2008, Vol 55(12): pp. 3476-3481

DOI Publication Publication

Highly Reliable 90-nm Logic Multitime Programmable NVM Cells Using Novel Work-Function-Engineered Tunneling Devices

Ron Paulsen

IEEE Transactions on Electron Devices | August 2007, Vol 54(9): pp. 2526-2530

DOI Publication Publication Publication Publication

Measurement of ultralow gate tunneling currents using floating-gate integrator technique

Ron Paulsen

IEEE Electron Device Letters | May 2005, Vol 26(5): pp. 329-331

DOI Publication Publication

Reliability of pFET EEPROM with 70-/spl Aring/ tunnel oxide manufactured in generic logic CMOS Processes

Ron Paulsen

IEEE Transactions on Device and Materials Reliability | December 2004, Vol 4(3): pp. 353-358

DOI Publication

A Sensitive Technique to Enable Technology Transfer and Fab Matching in Deep Sub-Micron Technologies ISSM Paper: PC-O-193

Ron Paulsen

December 2006

PDF